輻射效應概論
Radiation Effects in Electronics
| 節 | 週五 |
|---|---|
5 13:20–14:10 | 輻射效應概論 EE116（光復） 3 節連堂 |
6 14:20–15:10 | |
7 15:30–16:20 |
* 根據陽明交大上課時間表所列
了解輻射在電子元件中所產生的可靠度問題 To understand the hazardous effects and reliability issues caused by radiation in electronic devices and how to mitigate them.
基礎物理與半導體元件物理 Fundamental knowledge of physics and electronic devices
無備註
Power Point slides & handouts
Midterm exam (open note): 30% Final exam (open note): 40% Final report: 30%
教師未提供此項資料
| 週次 | 主題 |
|---|---|
| 第 1 週 | Course Orientation & Introduction 2/21 |
| 第 2 週 | Peace Memorial day 2/28 |
| 第 3 週 | Topic 1: Basic Knowledge on Radiation Effects and Soft Error 3/6 |
| 第 4 週 | Topic 2: Terrestrial Radiation 3/13 |
| 第 5 週 | Topic 3: Fundamentals of Radiation Effects 3/20 |
| 第 6 週 | Topic 3: Fundamentals of Radiation Effects 3/27 |
| 第 7 週 | Bridge holiday 4/3 |
| 第 8 週 | Topic 4: Fundamentals of Electronic Devices and Systems 4/10 |
| 第 9 週 | Topic 4: Fundamentals of Electronic Devices and Systems 4/17 |
| 第 10 週 | Midterm Exam 4/24 |
| 第 11 週 | Topic 5: Irradiation Test Methods 5/1 |
| 第 12 週 | Topic 5: Irradiation Test Methods 5/8 |
| 第 13 週 | Topic 6: Simulation Tool: PHITS 5/15 |
| 第 14 週 | Topic 6: Simulation Tool: PHITS 5/22 |
| 第 15 週 | Topic 6: Simulation Tool: PHITS 5/29 |
| 第 16 週 | Student Presentation 6/5 |
| 第 17 週 | Student Presentation 6/12 |
| 第 18 週 | Final Exam 6/19 |
Terrestrial Radiation Effects in ULSI Devices and Electronic Systems, Eishi H. Ibe, Published by Wiley in 2015
- 地點
- By appointment
- 時間
- By appointment
- 聯絡方式
- king@nctu.edu.tw