材料分析
Material Analysis
| 節 | 週四 |
|---|---|
6 14:20–15:10 | 材料分析 ED301（光復） 3 節連堂 |
7 15:30–16:20 | |
8 16:30–17:20 |
* 根據陽明交大上課時間表所列
This class will teach students to analyze electronic devices by material analysis methods.
Basic physic concepts.
無備註
ChemSpider Search and share chemistry: http://www.chemspider.com/StructureSearch.aspx X-ray Absorption Edges: http://skuld.bmsc.washington.edu/scatter/AS_periodic.html American Mineralogist Crystal Structure Database: http://rruff.geo.arizona.edu/AMS/amcsd.php
Oral research topic presentation 30% Attend 20% Midterm exam 25% Final exam 25%
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| 週次 | 主題 |
|---|---|
| 第 1 週 | Light Microscopy 2/17 |
| 第 2 週 | X-Ray Diffraction Methods 2/24 |
| 第 3 週 | Transmission Electron Microscopy 3/3 |
| 第 4 週 | Transmission Electron Microscopy 3/10 |
| 第 5 週 | Scanning Electron Microscopy 3/17 |
| 第 6 週 | Scanning Probe Microscopy 3/24 |
| 第 7 週 | Oral presentation 3/31 |
| 第 8 週 | Oral presentation 4/7 |
| 第 9 週 | Midterm Exam 4/14 |
| 第 10 週 | X-Ray Spectroscopy for Elemental Analysis 4/21 |
| 第 11 週 | Electron Spectroscopy for Surface Analysis 4/28 |
| 第 12 週 | Secondary Ion Mass Spectrometry for Surface Analysis 5/5 |
| 第 13 週 | Vibrational Spectroscopy for Molecular Analysis 5/12 |
| 第 14 週 | Oral presentation 5/19 |
| 第 15 週 | Oral presentation 5/26 |
| 第 16 週 | Final Exam 6/2 |
Materials characterization: introduction to microscopic and spectroscopic methods Leng, Y. (Yang) Weinheim, Germany: Wiley-VCH, c2013. 2nd ed.. c2013 Transmission electron microscopy: diffraction, imaging, and spectrometry Springer eBooks, Editors: Carter, Barry, Williams, David B. (Eds.) Cham: Springer International Publishing : Imprint: Springer, 2016. 2016
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