材料測試分析技術原理與應用
Principles and Applications of Materials Characterization Techniques
| 節 | 週三 |
|---|---|
2 09:00–09:50 | 材料測試分析技術原理與應用 EE118（光復） 3 節連堂 |
3 10:10–11:00 | |
4 11:10–12:00 |
* 根據陽明交大上課時間表所列
Semiconductor materials can be widely adopted in not only electronic devices/integrated circuits but also energy storage devices (Li-ion batteries) and solar cells. The focus of the lectures will be the analytical methods on materials but not devices, which can be applied to other physical and chemical scientific research topics. This course was designed for young semiconductor talents who are interested in characterization technologies applied in semiconductor materials.
Students with a science or engineering (Physics, Chemistry, Materials, Electronics, Semiconductors) degree can take this course.
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Attendance (bonus 10%); Homework Assignments (20%); Quiz (20%); Mid-term Exam (30%); Final Exam (30%)
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| 週次 | 主題 |
|---|---|
| 第 1 週 | Introduction to Semiconductor Materials – Warmup |
| 第 2 週 | X-ray Diffraction (XRD) Analysis (I) |
| 第 3 週 | X-ray Diffraction (XRD) Analysis (II) |
| 第 4 週 | Electron Microscopy (EM) and Elemental Analysis (I) |
| 第 5 週 | Electron Microscopy (EM) and Elemental Analysis (II) |
| 第 6 週 | Advanced Cryo- and In-Situ Electron Microscopy (EM) |
| 第 7 週 | Atomic Force Microscopy (AFM) |
| 第 8 週 | Spring break |
| 第 9 週 | Mid-term Exam |
| 第 10 週 | Thermal Analysis、Particle Size Analysis、Surface Area (BET) and Porosity |
| 第 11 週 | X-ray Photoelectron Spectroscopy (XPS)、Ultraviolet-visible Spectroscopy |
| 第 12 週 | Raman Spectroscopy、Fourier-Transform Infrared Spectroscopy (FTIR) |
| 第 13 週 | Electrochemical Analysis、Electrochemical Impedance Analysis (EIS) |
| 第 14 週 | Mass Spectrometry、Nuclear Magnetic Resonance (NMR) Spectroscopy |
| 第 15 週 | Review |
| 第 16 週 | Final Exam |
Presentation slides will be supplied by the lecturer.
- 地點
- MIRC R301
- 時間
- By appointment
- 聯絡方式
- yushengsu@nycu.edu.tw