元件輻射效應概論
Introduction to Radiation Effects in Electronics
| 節 | 週五 |
|---|---|
5 13:20–14:10 | 元件輻射效應概論 EE116（光復） 3 節連堂 |
6 14:20–15:10 | |
7 15:30–16:20 |
* 根據陽明交大上課時間表所列
了解輻射在電子元件中所產生的可靠度問題, 提升電子元件於核能設施與宇宙應用的效能 To understand the hazardous effects and reliability issues caused by radiation in electronic devices and how to mitigate them for the applications such as nuclear power facilities and space.
基礎物理與半導體元件物理 Fundamental knowledge of physics and electronic devices
無備註
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Midterm exam (open note): 30% Final exam (open note): 40% Final report: 30%
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| 週次 | 主題 |
|---|---|
| 第 1 週 | Introduction 2/18 |
| 第 2 週 | Radiation Basics 2/25 |
| 第 3 週 | Radiation Basics 3/4 |
| 第 4 週 | Fundamentals of Radiation Effects 3/11 |
| 第 5 週 | Fundamentals of Radiation Effects 3/18 |
| 第 6 週 | Radiation Test Methods 3/25 |
| 第 7 週 | Field Trip to Testing Facilities 4/1 |
| 第 8 週 | Midterm Exam 4/8 |
| 第 9 週 | SRIM & TRIM 4/15 |
| 第 10 週 | SRIM & TRIM 4/22 |
| 第 11 週 | Radiation Effects in Memories 4/29 |
| 第 12 週 | Radiation Effects in GaN Devices 5/6 |
| 第 13 週 | Application in Space 5/13 |
| 第 14 週 | Case Study 5/20 |
| 第 15 週 | Final Exam 5/27 |
| 第 16 週 | School Holiday 6/3 |
Terrestrial Radiation Effects in ULSI Devices and Electronic Systems, Eishi H. Ibe, Published by Wiley in 2015
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