2 項進行中

115-1 選課時程

進行中

  • 初選第一階段 6/15 – 6/18
  • 初選第二階段 6/22 – 6/25
  • 校際選修 進行中 8/24 – 9/18
  • 初選第三階段 8/31 – 9/3
  • 開學後加退選 進行中 9/7 – 9/21
  • 逾期加退選 9/21 – 9/24
選課資源

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電子構裝技術

Electronic Packaging Technology For Electronics

學期
110-2
學分
0 學分
當期課號
5392
永久課號
IMA5574
開課單位
材料科學與工程學系
授課教師
陳智
校區
光復
類別
選修
上課時間表
週二
週三
2
09:00–09:50
電子構裝技術
EF202(光復)
3
10:10–11:00
電子構裝技術
EF202(光復)
2 節連堂
4
11:10–12:00

* 根據陽明交大上課時間表所列

概述

This course will teach the fundamentals for packaging, including bonding, metallurgical reactions, and reliabilities. It will also cover science and technology of microelectronic packaging. Die Attach/Chip Bond, Wire Bond, Flip Chip Technology, Ball Grid Array Technology, Pb-based and Pb-free Solders, Ceramic Packaging, Plastic Packaging, Printed Circuit Boards, Chip Scale Packaging, Direct Chip Attach, system in packaging, state-of-the-art 3D IC packaging, Cu-Cu bonding. Metallurgical reactions between Cu-Sn, Ni-Sn, and Sn-Au. Sn whisker, Stress in thin films, Mean-time-to-failure measurement, Phase transformation and phase diagrams of solders.

先修科目

教師未提供此項資料

備註

無備註

教學方式

教師未提供此項資料

評分方式

1學期作業 None 2.評量方法 Two midterms : 40%, Final :20%; Term paper-paper critique : 20% Presentation : 20%

課程大綱

教師未提供此項資料

週次計畫
週次主題
第 1 週

Introduction; Die Bonding, Leadframe; Chip-level connection-- Wire bonding

2/15
第 2 週

Chip-level connections —TAB; Chip-on-film; Chip-level connection--Flip Chip Technology I-Introduction Reliability; Pb-based and Pb-free solders,

2/22
第 3 週

FCT Reliability :Metallurgical Reaction (I)

3/1
第 4 週

FCT Reliability :FCT Reliability :Metallurgical Reaction (II)

3/8
第 5 週

FCT Reliability: Metallurgical Reaction (III); Solder bump fabrication.

3/15
第 6 週

Midterm

3/22
第 7 週

FCT Reliability : Electromigration I,

3/29
第 8 週

Holidays

4/5
第 9 週

FCT Reliability: Electromigration II; Thermo-migration

4/12
第 10 週

Sn Whisker; Ceramic Packaging, Plastic Packaging, Printed Circuit Boards/PTH, SMT CPU packaging, Chip Scale Packaging,

4/19
第 11 週

Midterm/ Company Visiting- Chip Bond Technology-tentative

4/26
第 12 週

Fan-out packaging

5/3
第 13 週

3D IC Packaging; Effect of solder volume on the reliabilities of solder joints/microbumps.

5/10
第 14 週

3D IC Packaging; Cu direct bonding.

5/17
第 15 週

Group Presentation

5/24
第 16 週

Final Exam

5/31
教科書

Textbook: K. N. Tu, Hung-Ming Chen, Chih Chen. Electronic Packaging Science and Engineering, Wiley 2021. Reference books: 1. K. N. Tu, Solder Joint Technology: Materials, Properties, and Reliability (Springer 2007) 2. 3D Microelectronic packaging: from fundamentals to applications, Editors: Li, Yan, Goyal, Deepak (Eds.), Springer. 2. “Electronic Packaging, Design, Materials, Process, and Reliability”John Lau, C.P. Wong, John L. Prince, and Wataru Nakayama, McGraw-Hill. 3. “Principles of Electronic Packaging ”Donald P. Seraphim, Ronald C. Lasky, Che-yu Li, McGraw-Hill, 1993. 4. “Flip chip technologies” John H. Lau, McGraw-Hill, 1996. 5. “Fundamentals of Microsystems Packaging”, R.R. Tummala, McGraw-Hill, 2001 6微電子材料與製程,陳力俊主編中國材料科學學會 2000 7. Microelectronics packaging handbook” R.R. Tummala and E.J. Rymaszewski, Van Nostrand Reinhold, 1989. 8. Electronic Thin Film Science: For Electrical Engineers and Materials Scientists Tu, King-Ning/ Mayer, James W./ Feldman, Leonard C. 9. Fan-Out Wafer-Level Packaging, John H Lau, Springer, 2018.

Office Hours
地點
EF310
時間
TBA
聯絡方式
31814