半導體材料分析
Materials Characterization for Semiconductor
| 節 | 週一 |
|---|---|
A 18:30–19:20 | 半導體材料分析 3 節連堂 |
B 19:30–20:20 | |
C 20:30–21:20 |
* 根據陽明交大上課時間表所列
Course descriptions and objectives: Students will learn most semiconductor characterization techniques and know the fundamental semiconductor physics 1. Introduction of basics semiconductor physics and devices 2. Introduction of several semiconductor characterization techniques. It will include photoluminescence, Raman scattering, electron microscopy, scanning probe microscopy, and X-ray measurements.
Prerequisite: “Introduction to Solid State Physics” by Charles Kittel
無備註
ppt
Homework and Assignments, Exams and Quizzes, Evaluation and Grading Policy: (a) 40% for 8 homework and assignments, (b) 30% for mid-term exam, and (c) 30% for final exam
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| 週次 | 主題 |
|---|---|
| 第 1 週 | Introduction of semiconductor crystal structure and x-ray measurements 10/17 |
| 第 2 週 | Concept of semiconductor bandgap, n-type and p-type doping 10/24 |
| 第 3 週 | Introduction of p-n junction, light emitting diode, diode laser, bipolar transistor, and field effect transistor 10/31 |
| 第 4 週 | Measurements of bandgap: reflectivity, transmission, photoluminescence and modulation spectroscopy 11/7 |
| 第 5 週 | Optical properties of semiconductor studied by reflectivity, transmission, photoluminescence and modulation spectroscopy (I) 11/14 |
| 第 6 週 | Optical properties of semiconductor studied by reflectivity, transmission, photoluminescence and modulation spectroscopy (II) 11/21 |
| 第 7 週 | Lattice vibration and Raman scattering of semiconductors 11/28 |
| 第 8 週 | Mid-term exam 12/5 |
| 第 9 週 | Scanning probe microscopy of semiconductor nano-structures 12/12 |
| 第 10 週 | Scanning electron microscopy and cathode-luminescence of semiconductor nano-structures (I) 12/19 |
| 第 11 週 | Scanning electron microscopy and cathode-luminescence of semiconductor nano-structures (II) 12/26 |
| 第 12 週 | Electrical measurements 1/3 |
| 第 13 週 | Magnetic measurements 1/9 |
| 第 14 週 | Semiconductor characterization by using synchrotron radiation (I) 1/16 |
| 第 15 週 | Semiconductor characterization by using synchrotron radiation (II) 1/30 |
| 第 16 週 | Final exam 1/31 |
| 第 17 週 | Review of exam and course 2/6 |
| 第 18 週 | Review of exam and course 2/7 |
“Experimental Physics”, R.A. Dunlap, Oxford University Press, 1988 FUNDAMENTALS OF MICROSYSTEMS PACKAGING, By Rao R. Tummala,McGRAW-HILL
- 地點
- SC 502
- 時間
- Monday 17:00-18:00
- 聯絡方式
- wcchou957@nycu.edu.tw