電子材料
Electronic Materials
| 節 | 週五 |
|---|---|
6 14:20–15:10 | 電子材料 EF202（光復） 3 節連堂 |
7 15:30–16:20 | |
8 16:30–17:20 |
* 根據陽明交大上課時間表所列
1. To gain an understanding of the properties and applications of various materials (e.g. dielectrics, semiconductors) used in microelectronics and optoelectronics. 2. To apply the principles of physics, chemistry and structure to understand the fundamental phenomena contributing to the electrical and optical properties of materials. 3. To learn the fundamentals of thin film coatings, etching, and bulk crystal growth, including materials (gas) transport, epitaxy, and defects. To gain an understanding of the primary characterization methods that are used to study and measure the electrical, optical and physical properties of electronic and photonic materials.
General Physics (普通物理) or General Chemistry(普通化學) or Thermodynamics(熱力學)
無備註
電子材料作業繳交: 請各位同學繳交紙本至工六 EF755B 門口三層櫃上的箱子裡 (助教:湯惟竣)
Homework: 30% Mid-Term Examination 35% Final Examination (close book) 35%
教師未提供此項資料
| 週次 | 主題 |
|---|---|
| 第 1 週 | No class 2023-02-14(二),2023-02-16(四) |
| 第 2 週 | No class 2023-02-21(二),2023-02-23(四) |
| 第 3 週 | 1.Introduction 2.Bonding 2023-02-28(二),2023-03-02(四) |
| 第 4 週 | 1. Molecule Orbit Theory of Bonding 2. Semiconductor Band Structure 3. Effective Mass 2023-03-07(二),2023-03-09(四) |
| 第 5 週 | 1.Intrinsic Semiconductors 2.Extrinsic Semiconductors 3.Electrical Characterization 2023-03-14(二),2023-03-16(四) |
| 第 6 週 | 1.Resistivity Measurement 2.Hall-effect Measurement 3.Temperature Dependent of n, u, and Conductivity 2023-03-21(二),2023-03-23(四) |
| 第 7 週 | 1.Vacuum Science & Technology 2.Thin Film & Surface Phenomena 3.Nucleation & Growth 2023-03-28(二),2023-03-30(四) |
| 第 8 週 | 1.Bulk Crystal Growth 2.Thin Film Deposition/Epitaxy 3.Doping/Impurities/Defects 2023-04-04(二),2023-04-06(四) |
| 第 9 週 | 1.Adsorption/Emission/Photoluminescence 2.Raman Spectroscopy 2023-04-11(二),2023-04-13(四) |
| 第 10 週 | Mid-term exam 2023-04-18(二),2023-04-20(四) |
| 第 11 週 | 1.X-Ray Photoemission Spectroscopy 2.SIMS 3.Rutherford Back-Scattering 2023-04-25(二),2023-04-27(四) |
| 第 12 週 | 1.MOSFET Introduction 2.Dielectric 3.PN Diodes 2023-05-02(二),2023-05-04(四) |
| 第 13 週 | 1.Metal/Semiconductor Schottky Diode 2Ohmic Contacts 2023-05-09(二),2023-05-11(四) |
| 第 14 週 | 1.Contact Resistance 2.C-V Measurement 2023-05-16(二),2023-05-18(四) |
| 第 15 週 | 1.Schottky Barriers 2.Transistors 2023-05-23(二),2023-05-25(四) |
| 第 16 週 | Final exam 2023-05-30(二),2023-06-01(四) |
| 第 17 週 | 2023-06-09(五) |
| 第 18 週 | 2023-06-16(五) |
1. Principles of Electronic Materials and Devices (McGraw Hill, 4th Edition), by Safa Kasap 2. Semiconductor Material and Device Characterization (Wiley), by Dieter K. Schroder
- 地點
- EF311
- 時間
- Wednesday 1 PM - 3 PM
- 聯絡方式
- ycl194@nycu.edu.tw (老師:林御專) zx7676812.en10@nycu.edu.tw(助教:湯惟竣)