材料測試分析技術原理與應用
Principles and Applications of Materials Characterization Techniques
| 節 | 週五 |
|---|---|
2 09:00–09:50 | 材料測試分析技術原理與應用 EE132（光復） 3 節連堂 |
3 10:10–11:00 | |
4 11:10–12:00 |
* 根據陽明交大上課時間表所列
Semiconductor materials can be widely used not only in electronic devices/integrated circuits, but also in energy storage devices (Li-ion batteries) and solar cells. The focus of the lectures will be on the analytical methods on materials, but not on devices, which can be applied to other physical and chemical scientific research topics. This course is designed for young semiconductor talent interested in characterization techniques applied to semiconductor materials.
Students with a degree in science or engineering (physics, chemistry, materials, electronics, semiconductors) may take this course.
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Attendance (bonus 10%); Homework Assignments (20%); Quiz (20%); Mid-term Exam (25%); Final Exam (25%)
教師未提供此項資料
| 週次 | 主題 |
|---|---|
| 第 1 週 | Introduction to Semiconductor Materials – Warmup 2024-02-23(五) |
| 第 2 週 | X-ray Diffraction (XRD) Analysis (I) 2024-03-01(五) |
| 第 3 週 | X-ray Diffraction (XRD) Analysis (II)、X-ray Reflectometry (XRR) 2024-03-08(五) |
| 第 4 週 | Electron Microscopy (EM) and Elemental Analysis (I) 2024-03-15(五) |
| 第 5 週 | Electron Microscopy (EM) and Elemental Analysis (II) 2024-03-22(五) |
| 第 6 週 | Advanced Cryo- and In-Situ Electron Microscopy (EM)、Atomic Force Microscopy (AFM) 2024-03-29(五) |
| 第 7 週 | Spring break 2024-04-05(五) |
| 第 8 週 | Mid-term Exam 2024-04-12(五) |
| 第 9 週 | Applications of EM and AFM in Semiconductor Technologies 2024-04-19(五) |
| 第 10 週 | X-ray Photoelectron Spectroscopy (XPS)、Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)、Ultraviolet-visible Spectroscopy (UV-vis) 2024-04-26(五) |
| 第 11 週 | Applications of XPS、XRR、ToF-SIMS in Semiconductor Technologies 2024-05-03(五) |
| 第 12 週 | Raman Spectroscopy、Fourier-Transform Infrared Spectroscopy (FTIR) 2024-05-10(五) |
| 第 13 週 | Mass Spectrometry、Nuclear Magnetic Resonance (NMR) Spectroscopy 2024-05-17(五) |
| 第 14 週 | Thermal Analysis、Particle Size Analysis、Surface Area and Porosity 2024-05-24(五) |
| 第 15 週 | Electrochemical Analysis、Electrochemical Impedance Analysis (EIS) 2024-05-31(五) |
| 第 16 週 | Final Exam 2024-06-07(五) |
| 第 17 週 | 2024-06-14(五) |
| 第 18 週 | 2024-06-21(五) |
Presentation slides are provided by the instructor.
- 地點
- EF475
- 時間
- By appointment
- 聯絡方式
- yushengsu@nycu.edu.tw