半導體特性分析
Characterization of Semiconductor
| 節 | 週五 |
|---|---|
3 10:10–11:00 | 半導體特性分析 SC160（光復） 3 節連堂 |
4 11:10–12:00 | |
N 12:20–13:10 |
* 根據陽明交大上課時間表所列
Students will learn most semiconductor characterization techniques and know the fundamental semiconductor physics. 1. Introduction of basics semiconductor physics and devices. 2. Introduction of several semiconductor characterization techniques. It will include photoluminescence, Raman scattering, electron microscopy, scanning probe microscopy, and X-ray measurements.
NA
無備註
PPT
(a) 30% for 10 homework and assignments, (b) 30% for mid-term exam, and (c) 40% for final exam
教師未提供此項資料
| 週次 | 主題 |
|---|---|
| 第 1 週 | Introduction of semiconductor crystal structure and x-ray measurements 2024-09-06(五) |
| 第 2 週 | Concept of semiconductor bandgap, n-type and p-type doping 2024-09-13(五) |
| 第 3 週 | Introduction of p-n junction, light emitting diode, diode laser, bipolar transistor, and field effect transistor 2024-09-20(五) |
| 第 4 週 | Measurements of bandgap: reflectivity, transmission, photoluminescence and modulation spectroscopy 2024-09-27(五) |
| 第 5 週 | Optical properties of semiconductor studied by reflectivity, transmission, photoluminescence and modulation spectroscopy (I) 2024-10-04(五) |
| 第 6 週 | Optical properties of semiconductor studied by reflectivity, transmission, photoluminescence and modulation spectroscopy (II) 2024-10-11(五) |
| 第 7 週 | Lattice vibration and Raman scattering of semiconductors 2024-10-18(五) |
| 第 8 週 | mid-term exam 2024-10-25(五) |
| 第 9 週 | Scanning probe microscopy of semiconductor nano-structures 2024-11-01(五) |
| 第 10 週 | Scanning electron microscopy and cathode-luminescence of semiconductor nano-structures (I) 2024-11-08(五) |
| 第 11 週 | Scanning electron microscopy and cathode-luminescence of semiconductor nano-structures (II) 2024-11-15(五) |
| 第 12 週 | Electrical measurements 2024-11-22(五) |
| 第 13 週 | Magnetic measurements 2024-11-29(五) |
| 第 14 週 | Semiconductor characterization by using synchrotron radiation (I) 2024-12-06(五) |
| 第 15 週 | Semiconductor characterization by using synchrotron radiation (II) 2024-12-13(五) |
| 第 16 週 | Final exam 2024-12-20(五) |
“Experimental Physics”, R.A. Dunlap, Oxford University Press, 1988
- 地點
- SC502
- 時間
- Thursday 10:00-12:00 AM
- 聯絡方式
- email: wcchou957@nycu.edu.tw Tel: 5712121 ext 56129