CMOS 元件, 可靠度, 及應用之特論
Special Topics of CMOS Devices, Reliability, and Applications
| 節 | 週五 |
|---|---|
5 13:20–14:10 | CMOS 元件, 可靠度, 及應用之特論 ED116（光復） 3 節連堂 |
6 14:20–15:10 | |
7 15:30–16:20 |
* 根據陽明交大上課時間表所列
Course Objective: To equip each student with enough background (incl. “general information /common sense” 70-80%, and “knowledge”20-30%) to become a good Device (and/or FEOL Integration) Engineer in our semiconductor industry.
an entry level device physics course
無備註
google meet
6 HW attendance mid-term exam ~45%-50% final exam ~45%-50% 加分題 -- 0-10%
教師未提供此項資料
| 週次 | 主題 |
|---|---|
| 第 1 週 | CMOS evolution |
| 第 2 週 | CMOS evolution |
| 第 3 週 | Chap. 1&2 & 4 |
| 第 4 週 | Chap.5 & Tunneling |
| 第 5 週 | Tunneling, HKMG |
| 第 6 週 | HKMG |
| 第 7 週 | mid-term exam |
| 第 8 週 | Chap. 6 |
| 第 9 週 | Chap. 7 & Stress engineering |
| 第 10 週 | Layout dependent effects |
| 第 11 週 | layout dependent effects, IEDM /VLSI short courses |
| 第 12 週 | IEDM vlsi short courses / Hot carrier effects |
| 第 13 週 | Hot carrier effects / Memory |
| 第 14 週 | memory |
| 第 15 週 | final exam |
| 第 16 週 | final exam feedback |
"Modern Semiconductor devices for integrated circuits", by Chenming Hu
- 地點
- web based
- 時間
- after each class
- 聯絡方式
- ic.chen.tx@gmail.com