表面分析技術
Surface Analysis Techniques
| 節 | 週一 |
|---|---|
5 13:20–14:10 | 表面分析技術 EF207（光復） 3 節連堂 |
6 14:20–15:10 | |
7 15:30–16:20 |
* 根據陽明交大上課時間表所列
Physical and chemical characterization principles are broadly used in materials science and engineering. Surface and interface characterization is a major subject in nanotechnology, heterogeneous catalysis, semiconductor devices, functional materials, corrosion, energy missions, and tribology, etc. This course will study the physical and chemical principles of representative characterization methods frequently used in these research areas. The topics include surface chemistry and physics fundamentals, electron-based and x-ray spectroscopy, vibrational spectroscopy, ellipsometry, microscopy with atomic-scale probes, and data analysis. Students will learn a foundation in the use of characterization techniques to solve and diagnose material problems related to composition, structure, defects, and surfaces that can be identified and potentially resolved with materials characterization.
普通物理 (general physics),普通化學(general chemistry)、基礎材料科學導論(introduction to materials sciences), 電子材料 (electronic materials),固態物理 (solid-state physics)
無備註
在沒有外籍生的情況下,中文授課講解。 Before each exam, a review lecture will be provided to go over important knowledge. *Teaching Assistant: 王芊惠 (碩二)
Attendance -20% ; Midterm exam 1 -25% ; Midterm exam 2 - 25% ; Final presentation - 30% ; Extra scores are possible by other means.
教師未提供此項資料
| 週次 | 主題 |
|---|---|
| 第 1 週 | Introduction, Vaccum Technology 2025-09-01(一) |
| 第 2 週 | Optical Microscopy (OM), Scanning Electron Microscopy (SEM) 2025-09-08(一) |
| 第 3 週 | SEM and EDS 2025-09-15(一) |
| 第 4 週 | Auger Electron Microscopy (AES) 2025-09-22(一) |
| 第 5 週 | Vibrational spectroscopy: Fourier Transform Infrared Spectroscopy, Raman Spectroscopy, Interpretation of Vibrational Data 2025-09-29(一) |
| 第 6 週 | X-ray photoelectron spectroscopy (XPS) 2025-10-06(一) |
| 第 7 週 | Review & Midterm exam 2025-10-13(一) |
| 第 8 週 | Secondary Ion Mass Spectroscopy (SIMS) and Thermal Analysis 2025-10-20(一) |
| 第 9 週 | Scanning probe microscopy (SPM) and scanning tunneling microscopy (STM) 2025-10-27(一) |
| 第 10 週 | Surfaces and interfaces of electronic materials and localized states at surfaces and interfaces 2025-11-03(一) |
| 第 11 週 | Electronic material surfaces and surface electronic applications 2025-11-10(一) |
| 第 12 週 | Analysis and characterization of next-generation material surfaces and interfaces 2025-11-17(一) |
| 第 13 週 | Review & Final exam 2025-11-24(一) |
| 第 14 週 | Presentations 2025-12-01(一) |
| 第 15 週 | No class 2025-12-08(一) |
| 第 16 週 | Presentations 2025-12-15(一) |
1. "Surface Analysis – The Principal Techniques" (2nd Edition) by John C. Vickerman, Ian S. Gilmore, John Wiley & Sons, 2009 2. "An Essential Guide to Electronic Material Surfaces and Interfaces" (1st Edition) by Leonard J. Brillson, Wiley, 2016
- 地點
- Room 311 - 工程六館
- 時間
- By appointment
- 聯絡方式
- ycl194@nycu.edu.tw