電子材料
Electronic Materials
| 節 | 週一 |
|---|---|
5 13:20–14:10 | 電子材料 EF205（光復） 3 節連堂 |
6 14:20–15:10 | |
7 15:30–16:20 |
* 根據陽明交大上課時間表所列
1. To gain an understanding of the properties and applications of various materials (e.g. dielectrics, semiconductors) used in microelectronics and optoelectronics. 2. To apply the principles of physics, chemistry and structure to understand the fundamental phenomena contributing to the electrical and optical properties of materials. 3. To learn the fundamentals of thin film coatings, etching, and bulk crystal growth, including materials (gas) transport, epitaxy, and defects. To gain an understanding of the primary characterization methods that are used to study and measure the electrical, optical and physical properties of electronic and photonic materials.
General Physics (普通物理) or General Chemistry(普通化學) or Thermodynamics(熱力學)
無備註
教學方法: 英文授課、英文教材。 (This course will be provided in English. The course materials in terms of PowerPoints, the textbook, and reading are in English. However, the situation might be changed if we have foreign students enrolled in this course.) 助教(TA): 鄭至辰 (碩士生)
Homework [作業]: 15% Quiz [課堂小考]: 15% Mid-term exam [期中考](close book): 35% Final exam [期末考] (close book): 35% Good conductance/interaction: 5%
教師未提供此項資料
| 週次 | 主題 |
|---|---|
| 第 1 週 | Course Introduction 2026-02-23(一) |
| 第 2 週 | Molecule Orbit Theory of Bonding Basic Solid-State Physics 2026-03-02(一) |
| 第 3 週 | Band Structures Effective Mass Classification of Metals, Semiconductors, and Insulators 2026-03-09(一) |
| 第 4 週 | Intrinsic Semiconductors Extrinsic Semiconductors and Doping Carrier Concentration Semiconductor Junctions 2026-03-16(一) |
| 第 5 週 | Temperature Dependence of Carrier Concentration, Carrier Mobility, and Conductivity 2026-03-23(一) |
| 第 6 週 | Electrical Characterization (Resistivity Measurement, Hall-effect Measurement, 4-probe Measurement) 2026-03-30(一) |
| 第 7 週 | Optical Properties of Electronic Materials: Adsorption ,Emission, and Scattering 2026-04-06(一) |
| 第 8 週 | Surface Analysis Techniques (Raman, PL/EL/CL, XPS/AES, EDX, RBS, etc.) 2026-04-13(一) |
| 第 9 週 | Vacuum Science and Technology Thin Film Deposition Bulk Crystal Growth Review for the Mid-Term Exam 2026-04-20(一) |
| 第 10 週 | Mid-term Exam 2026-04-27(一) |
| 第 11 週 | Dielectric Materials Capacitors 2026-05-04(一) |
| 第 12 週 | Measuring Dielectric Materials (i.e., C-V Measurement and Dielectric Breakdown) 2026-05-11(一) |
| 第 13 週 | Metal-Semiconductor Schottky Diode Schottky Contact Ohmic Contact Contact Resistance Measurement 2026-05-18(一) |
| 第 14 週 | MOSFET Introduction and Operation Principles 2026-05-25(一) |
| 第 15 週 | Piezoelectric Materials Ferroelectric Materials Memory Devices 2026-06-01(一) |
| 第 16 週 | VLSI Technology Cleanroom Techniques and Lithography Review for the Final Exam 2026-06-08(一) |
| 第 17 週 | Final Exam 2026-06-15(一) |
| 第 18 週 | No Class 2026-06-22(一) |
1. Principles of Electronic Materials and Devices (McGraw Hill, 4th Edition), by Safa Kasap (primary textbook) 2. Semiconductor Material and Device Characterization (Wiley), by Dieter K. Schroder (supplementary) 3. (課外閱讀) 圖解半導體 -從設計、製成、應用一窺產業現況與展望，東販出版，井上伸雄、藏本貴文/著。
- 地點
- EF311 or in the same classroom
- 時間
- By appointment.
- 聯絡方式
- ycl194@nycu.edu.tw