2 項進行中

115-1 選課時程

進行中

  • 初選第一階段 6/15 – 6/18
  • 初選第二階段 6/22 – 6/25
  • 校際選修 進行中 8/24 – 9/18
  • 初選第三階段 8/31 – 9/3
  • 開學後加退選 進行中 9/7 – 9/21
  • 逾期加退選 9/21 – 9/24
選課資源

加入行事曆

選擇訂閱 Google Calendar,或下載通用的 ICS 檔案。

使用 Google Calendar 時,Google 會收到這份課表的公開連結。

元件精簡模型

Compact Modeling

學期
114-2
學分
3 學分
當期課號
535910
永久課號
STST30043
開課單位
國際半導體產業學院博士班、國際半導體產業學院碩士班
授課教師
吉里斯
校區
光復
類別
選修
上課時間表
週五
5
13:20–14:10
元件精簡模型
A306(光復)
3 節連堂
6
14:20–15:10
7
15:30–16:20

* 根據陽明交大上課時間表所列

概述

Compact models serve as a bridge or a translator between the physics-based half of the semiconductor industry (devices and foundries) and its computer-based half (EDA tools and IC design). This course will comprehensively cover the physics and modeling aspects of MOS capacitors and MOSFETs and also introduce advanced FETs such as FinFETs and Nanosheet/Gate-all-around FETs, along with their non-ideal effects. The course aims to delve into the strategies for developing models that meet the industry's requirements for accuracy, computational speed, and robustness. Students will be introduced to industry-standard models such as BSIM-BULK and BSIM-CMG and will also learn benchmarking tests for compact models. Additionally, the course will familiarize students with EDA tools, including TCAD, SPICE simulators, and the Verilog-A hardware description language, preparing them for real-world applications.

先修科目

Semiconductor physics fundamentals

備註

無備註

教學方式

教師未提供此項資料

評分方式

Midterm exam: 20% Final exam: 30% Homework + Project: 40% Class participation: 10%

課程大綱

教師未提供此項資料

週次計畫
週次主題
第 1 週

Holiday

2026-02-27(五)
第 2 週

Device Modeling Introduction, Need for Compact models for IC design, Compact modeling requirements, Simulation introduction (atomistic, TCAD, SPICE)

2026-03-06(五)
第 3 週

Introduction to SPICE: SPICE syntax and netlist, DC, AC, and transient analysis Verilog-A language introduction, compact modeling simplifications

2026-03-13(五)
第 4 週

Recap of Semiconductor Physics Fundamentals

2026-03-20(五)
第 5 週

Modeling of Metal Oxide Semiconductor (MOS) Capacitor: Types of oxide charges, Flat band voltage, Impact of gate biasing conditions and Band diagrams: physics of accumulation, depletion, and inversion

2026-03-27(五)
第 6 週

Holiday

2026-04-03(五)
第 7 週

Modeling of Metal Oxide Semiconductor (MOS) Capacitor: charge/surface potential approximations in different MOS operating regions, Numerical solution of surface potential for Three-terminal MOS structure

2026-04-10(五)
第 8 週

Mid-term exam

2026-04-17(五)
第 9 週

MOSFET Modeling: Operating principle, Charge-surface potential relation, Accumulation, depletion, and inversion characteristics.

2026-04-24(五)
第 10 週

Holiday

2026-05-01(五)
第 11 週

MOSFET Modeling: Pinch-off voltage, Current models, Subthreshold swing and Boltzmann limit, Threshold voltage, and Case studies of industry-standard BSIM4 and BSIM-BULK models.

2026-05-08(五)
第 12 週

Modeling of Real Device Effects: Mobility degradation and scattering mechanisms, Parasitic series resistances, Temperature effects, Self-heating, Short channel effects, Velocity saturation, Channel length modulation, Ballistic operation, Hot Carriers and impact Ionization, Quantum mechanical effects, Leakage currents.

2026-05-15(五)
第 13 週

Advanced MOSFET Models: Moore's Law and Dennard's Scaling, Introduction to FinFET, FDSOI, and GAAFET Technologies Introduction to industry-standard BSIM-CMG model

2026-05-22(五)
第 14 週

Transient Modeling: Quasi-static approximation, Modeling of terminal charges and capacitances, Transit time, Limitations of quasi-static approach, Introduction non-quasi-static models.

2026-05-29(五)
第 15 週

Industry-standard compact model features and tests: Parameter binning, Instance parameters vs model parameters, Local parameter fitting vs global parameter fitting, Benchmarking tests.

2026-06-05(五)
第 16 週

Final exam.

2026-06-12(五)
教科書

1. Y. Tsividis and C. McAndrew, "Operation and Modeling of the MOS Transistor", Oxford Univ. Press, 2010 2. G. Gildenblat, "Compact Modeling: Principles, Techniques and Applications", Springer, 2010 3. W. Liu and C. Hu, "Bsim4 and MOSFET Modeling For IC Simulation", World Scientific Publishing Co., 2011 4. CC Enz, “Charge-based MOS transistor modeling: the EKV model for low-power and RF IC design”. John Wiley & Sons; 2006. 5. C. Hu, "Modern Semiconductor Devices for Integrated Circuits", Pearson, 2009

Office Hours
地點
EF471
時間
Monday 3-4 pm or by appointment
聯絡方式
girish@nycu.edu.tw