表面分析
Surface Analysis
| 節 | 週二 |
|---|---|
5 13:20–14:10 | 表面分析 EV407（光復） 3 節連堂 |
6 14:20–15:10 | |
7 15:30–16:20 |
* 根據陽明交大上課時間表所列
This course introduces students several instrumental techniques for surface characterization. In addition, the principles and data interpretation of the analysis will be taught. Through these characterizations, students are able to identify the surface properties including chemical compositions, speciation, textures, and functional groups. These results can help students to better understand their materials and explore surface phenomenon in different environmental conditions.
Basic chemistry and physics
無備註
h
Midterm exam. (35 %)/ (Oct. 29, 2024) Final exam. (35 %) /(Dec. 17, 2024) Term papers (20 %) Class performance (10 %)
1. Surface concept and instrumentation overview 2. Chemcial information of surface (AUGER, ESCA, SIMS, FTIR) 3. Structural information of surface (SPM)
| 週次 | 主題 |
|---|---|
| 第 1 週 | Course Introduction 2026-09-08(二) 時數：[2026-09-08]張淑閔(2.00) |
| 第 2 週 | Vacuum system 2026-09-15(二) 時數：[2026-09-15]張淑閔(3.00) |
| 第 3 週 | Moon Festival (no class) 2026-09-22(二) 時數：[2026-09-22]張淑閔(3.00) |
| 第 4 週 | X-ray photoelectron spectroscopy (XPS) 2026-09-29(二) 時數：[2026-09-29]張淑閔(3.00) |
| 第 5 週 | X-ray photoelectron spectroscopy (XPS) 2026-10-06(二) 時數：[2026-10-06]張淑閔(3.00) |
| 第 6 週 | X-ray photoelectron spectroscopy (XPS) 2026-10-13(二) 時數：[2026-10-13]張淑閔(3.00) |
| 第 7 週 | Auger electron spectroscopy (AES) 2026-10-20(二) 時數：[2026-10-20]張淑閔(3.00) |
| 第 8 週 | Auger electron spectroscopy (AES) 2026-10-27(二) 時數：[2026-10-27]張淑閔(3.00) |
| 第 9 週 | Midterm 2026-11-03(二) 時數：[2026-11-03]張淑閔(3.00) |
| 第 10 週 | Secondary ion mass spectroscopy (SIMS) 2026-11-10(二) 時數：[2026-11-10]張淑閔(3.00) |
| 第 11 週 | Secondary ion mass spectroscopy (SIMS) 2026-11-17(二) 時數：[2026-11-17]張淑閔(3.00) |
| 第 12 週 | Secondary ion mass spectroscopy (SIMS) 2026-11-24(二) 時數：[2026-11-24]張淑閔(3.00) |
| 第 13 週 | Scanning probe microscopy (SPM) 2026-12-01(二) 時數：[2026-12-01]張淑閔(3.00) |
| 第 14 週 | Scanning electron microscope (SEM) 2026-12-08(二) 時數：[2026-12-08]張淑閔(3.00) |
| 第 15 週 | Fourier transform infrared spectroscopy (FTIR) 2026-12-15(二) 時數：[2026-12-15]張淑閔(3.00) |
| 第 16 週 | Final Exam 2026-12-22(二) 時數：[2026-12-22]張淑閔(3.00) |
John C. Vickerman, "Surface Analysis_The Principal Technique", Wiley. (※ 請同學遵守智慧財產權觀念及勿使用非法影印教科書。 )
- 地點
- R407
- 時間
- Flexible. Make appointments with e-mail.
- 聯絡方式
- email to chang@nycu.edu.tw