尖端計量學以及能譜與顯微術之基礎與應用
Advanced Metrology, Spectroscopies and Microscopies: Fundamentals and Applications
| 節 | 週一 |
|---|---|
2 09:00–09:50 | 尖端計量學以及能譜與顯微術之基礎與應用 3 節連堂 |
3 10:10–11:00 | |
4 11:10–12:00 |
* 根據陽明交大上課時間表所列
Advanced Metrology, Spectroscopy and Microscopy: Fundamentals and Applications COLLEGE OF ENGINEERING Taiwan International Graduate Program for Sustainable Chemical Science Instructor LI-CHYONG CHEN This course offers a comprehensive exploration of physical measurements, starting with the foundational concepts of time, space, and mass. These fundamentals serve as a stepping stone to more specialized studies, including the technology and methods surrounding vacuum measurement. The curriculum then transitions into a detailed examination of electron dynamics and properties, an area that spans several key technologies. The discussion on electron dynamics begins with electrochemistry, where students will delve into how electron measurements influence material science through chemical processes. This segment seamlessly leads into the study of magnetism and spintronics, where participants will learn about magnetic properties and spin dynamics, exploring various measurement techniques such as Hall effects and Josephson junctions. The course further extends into electron microscopy, specifically through Transmission Electron Microscopy (TEM) and Scanning Tunneling Microscopy (STM), which are pivotal in characterizing materials at the atomic level. As we explore these dynamic properties, we also focus on thermal measurements—a critical yet often underdeveloped area in physics. This part of the course covers thermal physics, including calorimetry, temperature measurements, and thermal transport measurements. Topics range from classical diffusive and ballistic transport to advanced quantum and anomalous transport phenomena. This section is vital for understanding the energy aspects of physical properties and their measurement challenges. Following the deep dive into electron-related technologies and thermal phenomena, the course shifts focus to the study of light and photonics. This section covers a range of photon-based techniques, including X-ray and neutron diffraction, X-ray absorption spectroscopy, and surface spectroscopies like X-ray Photoelectron Spectroscopy (XPS) and Ultraviolet Photoelectron Spectroscopy (UPS). Additionally, photoluminescence spectroscopy is discussed, highlighting its application in studying material properties. The course concludes with advanced optical imaging techniques such as Scanning Near-field Optical Microscopy (SNOM) and ultrafast pump-probe transient absorption spectroscopy, which are essential for understanding interactions within nanostructured materials. Through a structured progression from basic principles to complex technologies, the course equips students with a thorough understanding of measurement techniques and their application across diverse scientific fields. This approach not only underscores the interconnectedness of these techniques but also their crucial roles in advancing contemporary scientific research and technological innovation. This course offers a comprehensive exploration of physical measurements, starting with the foundational concepts of time, space, and mass. These fundamentals serve as a stepping stone to more specialized studies, including the technology and methods surrounding vacuum measurement. The curriculum then transitions into a detailed examination of electron dynamics and properties, an area that spans several key technologies. The discussion on electron dynamics begins with electrochemistry, where students will delve into how electron measurements influence material science through chemical processes. This segment seamlessly leads into the study of magnetism and spintronics, where participants will learn about magnetic properties and spin dynamics, exploring various measurement techniques such as Hall effects and Josephson junctions. The course further extends into electron microscopy, specifically through Transmission Electron Microscopy (TEM) and Scanning Tunneling Microscopy (STM), which are pivotal in characterizing materials at the atomic level. As we explore these dynamic properties, we also focus on thermal measurements—a critical yet often underdeveloped area in physics. This part of the course covers thermal physics, including calorimetry, temperature measurements, and thermal transport measurements. Topics range from classical diffusive and ballistic transport to advanced quantum and anomalous transport phenomena. This section is vital for understanding the energy aspects of physical properties and their measurement challenges. Following the deep dive into electron-related technologies and thermal phenomena, the course shifts focus to the study of light and photonics. This section covers a range of photon-based techniques, including X-ray and neutron diffraction, X-ray absorption spectroscopy, and surface spectroscopies like X-ray Photoelectron Spectroscopy (XPS) and Ultraviolet Photoelectron Spectroscopy (UPS). Additionally, photoluminescence spectroscopy is discussed, highlighting its application in studying material properties. The course concludes with advanced optical imaging techniques such as Scanning Near-field Optical Microscopy (SNOM) and ultrafast pump-probe transient absorption spectroscopy, which are essential for understanding interactions within nanostructured materials. Through a structured progression from basic principles to complex technologies, the course equips students with a thorough understanding of measurement techniques and their application across diverse scientific fields. This approach not only underscores the interconnectedness of these techniques but also their crucial roles in advancing contemporary scientific research and technological innovation. The course then brings into focus photoluminescence spectroscopy and its critical role in exciton sciences, particularly emphasizing its application in solar cell research and the study of electronic band structures. This prepares students for the final segments on advanced optical imaging techniques and X-ray absorption spectroscopy, where light-matter interactions and atomic structure analyses are discussed. These techniques showcase the culmination of measurement principles in understanding and developing new materials and technologies. Throughout the course, the narrative weaves together the theoretical and practical aspects of each topic, creating a cohesive understanding of the vast field of measurement science. This comprehensive approach not only equips students with deep insights into each measurement technique but also demonstrates their interconnectedness and relevance to contemporary scientific challenges and innovations. Students will have deep understanding of characterization techniques and how to leverage those techniques to benefit their own research. This course offers a comprehensive exploration of physical measurements, starting with the foundational concepts of time, space, and mass. These fundamentals serve as a stepping stone to more specialized studies, including the technology and methods surrounding vacuum measurement. The curriculum then transitions into a detailed examination of electron dynamics and properties, an area that spans several key technologies. The discussion on electron dynamics begins with electrochemistry, where students will delve into how electron measurements influence material science through chemical processes. This segment seamlessly leads into the study of magnetism and spintronics, where participants will learn about magnetic properties and spin dynamics, exploring various measurement techniques such as Hall effects and Josephson junctions. The course further extends into electron microscopy, specifically through Transmission Electron Microscopy (TEM) and Scanning Tunneling Microscopy (STM), which are pivotal in characterizing materials at the atomic level. As we explore these dynamic properties, we also focus on thermal measurements—a critical yet often underdeveloped area in physics. This part of the course covers thermal physics, including calorimetry, temperature measurements, and thermal transport measurements. Topics range from classical diffusive and ballistic transport to advanced quantum and anomalous transport phenomena. This section is vital for understanding the energy aspects of physical properties and their measurement challenges. Following the deep dive into electron-related technologies and thermal phenomena, the course shifts focus to the study of light and photonics. This section covers a range of photon-based techniques, including X-ray and neutron diffraction, X-ray absorption spectroscopy, and surface spectroscopies like X-ray Photoelectron Spectroscopy (XPS) and Ultraviolet Photoelectron Spectroscopy (UPS). Additionally, photoluminescence spectroscopy is discussed, highlighting its application in studying material properties. The course concludes with advanced optical imaging techniques such as Scanning Near-field Optical Microscopy (SNOM) and ultrafast pump-probe transient absorption spectroscopy, which are essential for understanding interactions within nanostructured materials. Through a structured progression from basic principles to complex technologies, the course equips students with a thorough understanding of measurement techniques and their application across diverse scientific fields. This approach not only underscores the interconnectedness of these techniques but also their crucial roles in advancing contemporary scientific research and technological innovation. The course then brings into focus photoluminescence spectroscopy and its critical role in exciton sciences, particularly emphasizing its application in solar cell research and the study of electronic band structures. This prepares students for the final segments on advanced optical imaging techniques and X-ray absorption spectroscopy, where light-matter interactions and atomic structure analyses are discussed. These techniques showcase the culmination of measurement principles in understanding and developing new materials and technologies. Throughout the course, the narrative weaves together the theoretical and practical aspects of each topic, creating a cohesive understanding of the vast field of measurement science.
教師未提供此項資料
無備註
教師未提供此項資料
Midterm Essay 15% Midterm Oral Presentation 15% Final Exam 55% Engagement in Class 15%
教師未提供此項資料
| 週次 | 主題 |
|---|---|
| 第 1 週 | Time, space & mass: Metrology, science & technology in various temporal, length and gravimetric scales |
| 第 2 週 | Pressure, from high pressure to UHV |
| 第 3 週 | Phonon, calorimetry, temperature, Boltzmann distribution, KBT |
| 第 4 週 | Holiday |
| 第 5 週 | Charge, EC measurements and charge transfer across the interface |
| 第 6 週 | Spin, magnetism, Hall effects and Josephson junctions |
| 第 7 週 | XRD & neutron diffraction |
| 第 8 週 | Holiday |
| 第 9 週 | SEM and related material characterization tools (Essay Due) |
| 第 10 週 | TEM, EELS, STEM, Cs-TEM/STEM |
| 第 11 週 | AFM, STM, STS (Oral Presentation Due) |
| 第 12 週 | Raman, UV-VIS, XPS/UPS |
| 第 13 週 | PL, TRPL, exciton science |
| 第 14 週 | SNOM, confocal microscopy & ultrafast pump-probe TAS |
| 第 15 週 | XAS, in-situ/operando XAS, etc., current status/future perspective of NSRRC |
| 第 16 週 | Final Exam (Written Test) |
HIGGINS,K.;Miner,D.,SMITH,C.N.;SULLIVAN,D.B.(2004),Awalkthroughtime(version1.2.1).[Online]Available:http://physics.nist.gov/time[2010,July12].NationalInstituteofStandardsandTechnology,Gaithersburg,MD. SWYT,DennisA(2001),LengthanddimensionalmeasurementsatNIST.JournalofResearchoftheNationalInstituteofStandardsandTechnology,106.1:1. JABBOUR,ZeinaJ.;YANIV,SimoneL.(2001),Thekilogramandmeasurementsofmassandforce.JournalofResearchoftheNationalInstituteofStandardsandTechnology,106.1:25. CHANG,C.W.(2018),Non-diffusivethermalconductioninone-dimensionalmaterials.AAPPSBulletin28,vol6,p15. CULLITY,B.D.andSTOCK,S.R.(2001),ElementsofX-raydiffractions,3rdEd.,Pearson REIMER,Ludwig(2008),Transmissionelectronmicroscopy:physicsofimagingformation,Chapter7(ElectronScattering),Springer.
- 地點
- 教師未提供此項資料
- 時間
- 教師未提供此項資料
- 聯絡方式
- 教師未提供此項資料
